Single-Event Effects Analysis Using TCAD and Circuit Domain Combined Simulations

Title: Single-Event Effects Analysis Using TCAD and Circuit Domain Combined Simulations
Authors: S. Mateos-Angulo, M. San-Miguel-Montesdeoca, S.L. Khemchandani, J. del Pino
Conference name: Biannual European – Latin American Summer School on Design, Test and Reliability 2017 (BELAS 2017)

Esta entrada fue publicada en 2017, Conference Papers, dmayor, jpino, mario, smateos, sunil. Guarda el enlace permanente.