Analysis of Single Event Transients in Conventional LNA Topologies and Radiation Hardening Approaches

Title: Analysis of Single Event Transients in Conventional LNA Topologies and Radiation Hardening Approaches
Authors: M. San-Miguel-Montesdeoca, S. Mateos-Angulo, S.L. Khemchandani, J. del Pino
Conference name: Biannual European – Latin American Summer School on Design, Test and Reliability 2017 (BELAS 2017)

Esta entrada fue publicada en 2017, Conference Papers, jpino, mario, smateos, sunil. Guarda el enlace permanente.